TY - CHAP SN - 9783527687732 AU - Birk, Udo AU - Best, Gerrit AU - Amberger, Roman AU - Cremer, Christoph T1 - Super-Resolution Microscopy T2 - Fluorescence Microscopy. From Principles to Biological Applications ED - Kubitscheck, Ulrich PY - 2017 CY - Weinheim PB - Wiley-VCH SP - 291 EP - 319 AB - Fluorescence microscopy techniques using patterned illumination light offer the opportunity to extract high-resolution object information beyond the conventional resolution limit. This chapter describes in detail two widefield methods that apply interference of the excitation light to make high-resolution object information accessible. These are structured illumination microscopy (SIM) (also referred to as patterned excitation microscopy, PEM) and spatially modulated illumination (SMI). In SIM, the object is illuminated with a periodic illumination pattern. This pattern is used in order to manipulate the object's spatial frequencies. Two methods to spatially modulate the excitation intensity in SIM are common: two-beam interference, also called fringe projection, and three-beam interference, the so-called grid projection. The secondary focus of this chapter is on the less common method of SMI, where two opposing objective lenses are used to generate a high-frequency interference pattern along the optical axis. The SMI method is used to measure the size of nanostructures with great precision. DO - 10.1002/9783527687732.ch9 T4 - Interference and Pattern Techniques M4 - Citavi ER -